Defect Risk is calculated using the following rules:
If all measurements are in spec, and one or more parameters has:
- Cpk or Ppk > 1.33, defect risk is set to LOW
- 1.00 < Cpk or Ppk < 1.33, defect risk is set to MEDIUM
- Cpk or Ppk < 1.00, defect risk is set to HIGH
However, if one or more measurements is out of spec, defect risk is automatically set to HIGH even if Cpk, Ppk are >1.00.
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NOTE: If this metric creates too many false alarms for you, we recommend changing the following Setting from All Specifications to Key Only:
Display Cpk, Ppk for "Key Characteristics" only.
